Correlated Solutions is proud to introduce a line new of custom triggering and data acquisition devices developed specifically for Digital Image Correlation.

Dr. Calvin Stewart and his team at The Ohio State University are working at the extremes. In 2021, Dr. Stewart founded the Materials at Extremes Lab (MATX) and began to assemble the tools and personnel he needed to push the boundaries of “advanced manufacturing, mechanical testing, and theoretical mechanics of materials subject to thermal, mechanical, and chemical extremes.”

This video covers the fundamentals of creating an effective speckle pattern for digital image correlation. In digital image correlation, one or more cameras take a series of images as a specimen deforms. Measurements are taken by precisely analyzing the position of unique groups of speckles on the surface of the object as it moves through successive images. Using an optimal speckle pattern is one of the most important factors in reducing measurement noise and improving overall DIC results, therefore, understanding the requirements of an ideal speckle pattern and how to apply one to a specimen is a vital part of DIC. In this tutorial, we briefly discuss the theoretical background of DIC, then we’ll cover general speckle pattern requirements and outline some common application methods.